Tester
LD Tester For Research And Development
LD342L/S -RT/LT
Overview
This device is a desktop LD test system for research and development that semi-automatically measures the electrical and optical characteristics of long-wavelength / short-wavelength laser diodes in TO-CAN, bare chip, COS, and COC states.
Test Object
TO-CAN package: φ5.6, φ9.0, bare chip, COS, COC (compatible with various jigs)
* Please contact us for other special packages. Prepare a special jig.
Long wavelength LD: L type, short wavelength LD: S type
Temperature Control Method / Range
・ Controlled by Peltier and water-cooled chillers
・ -40 ℃ ～ 95 ℃: LT type, ・ 20 ℃ ～ 95 ℃: RT type,
Setting items
Standard item
・ IL measurement (CW, Pulse)
・ FFP measurement (vertical)
・ FFP measurement (horizontal)
-IrLD / IrPD / Im (LD reverse current / PD reverse current / Im current)
・ Wavelength measurement
Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360
Shortwave: YOKOGAWA AQ6373B