Tester
Chip Bar Tester /
Semi-auto Manual Type
LD2300CF
Overview
This device is an LD test system that automatically measures the electrical and optical characteristics of a long-wavelength SOA array in the chip bar state. Set the SOA array on the special jig, adjust the position with the monitor camera, and automatically perform "IL / IV measurement", "FFPV, H measurement", and "wavelength measurement".
Test Object
SOA Array Resonator Length: ~ 6000 μm, Chip Bar Length: 5 ~ 20 mm
Supply
・ Dedicated jig x1
Temperature Range
・20℃～95℃
Setting Items
Standard item
・ IL / IV measurement, Ir / Vr measurement (CW, Pulse)
・ FFP measurement (vertical)
・ FFP measurement (horizontal)
・ Wavelength measurement: Standard compatible equipment
Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360
* TM / TE filter is automatically switched. 1530/1540/1550/1560nm Each wavelength filter is manually switched. (FFP measurement)
* TM / TE filter and 1530/1540/1550 / 1560nm wavelength filters are automatically switched. (Wavelength measurement)
Details :