top of page
光ファイバー
privacy_title.jpg

​Tester

浅蓝色背景.png

TO-CAN LD Temperature Characteristic Test Equipment

LD3600F
3600F_副本2_副本.png

Overview

This device is an LD test system that automatically measures the electrical and optical characteristics of a laser diode in the TO-CAN state under normal temperature (25 ° C), low temperature (-40 ° C), and high temperature (85 ° C) environments. 160 elements are mounted on the jig board and installed.

After measuring the characteristics of 160 elements at the set temperature, move to the next temperature, stabilize the temperature, and then measure 160 elements in that temperature environment. Automatic measurement is performed based on the temperature pattern specified in advance.

The measurement target can be both long wave and short wave. (Pre-designation required)

In particular, it has been highly evaluated by various companies in the industry as a long-wave (for optical communication) CAN evaluation device.

LD3600F is an improved version of LD3600D, with two sets of 160 jig boards mounted, and while one of the jigs is measuring.

It is a device that aims to absorb the maximum loss time, which is the temperature rise and fall time, by raising and lowering the temperature of one of the jigs. The measurement items are IL / IV and λ as well as LD3600D.

Test Object

TO-CAN LD

* Please contact us for CAN shape, number of pins, and polarity arrangement.

Supply

・ 160 elements (TO-CAN) mounting jig board x 2 type

Temperature Control Method / Range

・ Controlled by Peltier, heater, and water-cooled chiller

・ -40 ℃ ~ 95 ℃

Chamber Test Room

The measurement room has a chamber structure, and during the -40 ° C test, the inside of the tank is filled with dry air or N2 gas to prevent dew condensation.

Setting Items

Standard item

・ IL / IV measurement (CW)

・ Ir / Vr measurement

・ Wavelength measurement: Standard compatible equipment

Long wave: ANRITSU MS9740B, YOKOGAWA AQ6360

Shortwave: YOKOGAWA AQ6373B

Details :

bottom of page