Tester
LD Chip Tester
LD2735VF
更新中
Overview
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of a bare-chip Multi beam VCSEL at high speed. Flip chip Multi beam VCSEL (top emission, bottom 2 electrodes) and normal Multi beam VCSEL (top emission, top and bottom electrodes). It is possible to support two types of chips without replacing the holder. The measurement items are "IL / IV measurement", "wavelength measurement", and "NFP measurement".
Test Object
Flip Chip Multi Beam VCSEL Bare Chip
Multi-beam VCSEL bare chip
* CW6A, PULSE10A, 10W
Supply/Storage
・ Supply: 6 “Grip ring x 1”
・ Storage: Bin Block x6
Measuring Holder
・ Index turntable method (1 unit / temperature)
・ 4 stations / TT type measurement is 2 stations, supply and storage are 2 stations.
・ Measurement holder: 4 holders
Temperature range
・ 20 ℃ ～ 90 ℃
Setting Items
Standard item
・ IL / IV measurement, Ir / Vr measurement (CW, Pulse)
・ Wavelength measurement: OCEAN OPTICS Maya 2000PRO
・ NFP measurement (MULTI BEAM evaluation)
Details :