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LD Chip Tester
LD2930MTB
(Under Development)
Updating
Overview
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (for optical communication) laser diodes in the bare chip state at high speed.
LD2930MTB is a measurement of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", and "wavelength measurement" at 3 temperatures (normal temperature, high temperature, low temperature (-40 ° C to 95 ° C)). Measure the item.
Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.
Test Object
Laser diode bare chip
* Please contact us for tip size and shape.
Supply
・6“グリップリングｘ1
Storage
・ 6 “Grip ring x6
+ NG shooter
* Gel pack support is available as an option. Please contact us.
Measuring Holder
・ Index turntable method (3 units / 3 temperatures)
・ 2 stations / TTx3TT type
Position 1: Supply, storage, gaugeing position
Position 2: Probing, measurement position
(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)
・ Measurement holder: 2 holders x 3TT
Temperature range
・-40℃～95℃
Chamber test room / Supply / Discharge pass box
The measurement room has a chamber structure, and during the -40 ° C test, the inside of the tank is filled with dry air or N2 gas to prevent dew condensation. The grip ring can be taken in and out of the measurement room via the pass boxes on the left and right.
Contact Method
・ Needle type probe contacts top electrode, bottom electrode contacts by measurement stage.
Setting Items
Standard item
Normal temperature / low temperature or high temperature
・ IL measurement (CW, Pulse) FRONT / BACK (normal temperature only) Simultaneous measurement
・ Ir / Vr measurement
・ Wavelength measurement: Standard compatible equipment
ANRITSU MS9740B
YOKOGAWA AQ6360
Optional items
・ OCR character reading
・ RF high frequency superimposition
・ EA measurement
Details :