Tester
LD Chip Tester
LD2920TB
Overview
This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (for optical communication) laser diodes in the bare chip state at high speed.
LD2900TB measures measurement items of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", and "wavelength measurement" at 2 temperatures (normal temperature / high temperature (20 ° C to 95 ° C)).
Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.
Test Object
Laser diode bare chip
* Please contact us for chip size and shape.
Supply
・ 6 “Grip ring x1
Storage
・ 6 “Grip ring x3
+ NG shooter
* Gel pack support is available as an option. Please contact us.
Measuring Holder
・ Index turntable method (2 units / 2 temperatures)
・ 2 stations / TTx2TT type
Position 1: Supply, storage, gaugeing position
Position 2: Probing, measurement position
(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)
・ Measurement holder: 2 holders x 2TT
Temperature Range
・20℃～95℃
Contact Method
・ Needle type probe contacts top electrode, bottom electrode contacts by measurement stage
Setting Items
Standard items Normal temperature / high temperature
・ IL measurement (CW, Pulse) FRONT / BACK (normal temperature) simultaneous measurement
・ Ir / Vr measurement
・ Wavelength measurement: Standard compatible equipment
ANRITSU MS9740B
YOKOGAWA AQ6360
Optional items
・ OCR character reading
・ RF high frequency superimposition
・ EA measurement
Details :