Tester

　　　Tester Division

　　・Target Laser Diode

　　　　・LD Tester

　　　　・LED Tester

LD Chip Tester

LD2920MTB

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Overview

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (for optical communication) laser diodes in the bare chip state at high speed.

LD2920MTB is a measurement of "IL measurement (FRONT / BACK)", "IV measurement", "Ir, Vr measurement", "wavelength measurement" at 2 temperatures (normal temperature / low temperature or high temperature (-40 ° C to 95 ° C)). Measure the item.

Customers can add necessary items such as "OCR function", "RF high frequency superimposition", and "EA measurement" as options.

Test Object

Laser diode bare chip

* Please contact us for tip size and shape.

Supply

・ 6 “Grip ring x1

Storage

・ 6 “Grip ring x3

+ NG shooter

* Gel pack support is available as an option. Please contact us.

Measuring Holder

・ Index turntable method (2 units / 2 temperatures)

・ 2 stations / TTx2TT type

Position 1: Supply, storage, gaugeing position

Position 2: Probing, measurement position

(IL measurement (FRONT / BACK), IV measurement, Ir, Vr measurement, wavelength measurement)

・ Measurement holder: 2 holdersx 2TT

Temperature range

・-40℃～95℃

Chamber test room / Supply / Discharge pass box

The measurement room has a chamber structure, and during the -40 ° C test, the inside of the tank is filled with dry air or N2 gas to prevent dew condensation. The grip ring can be taken in and out of the measurement room via the pass boxes on the left and right.