Tester

　　・Target Laser Diode

　　　　・LD Tester

　　　　・LED Tester

High Output Type

LD Tester

LD4500DAT

Overview

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of ultra-high power lasers in COS and CHIP states.

Test Object

COS L = 3000-6000 μm, W = 3000-6000 μm

CHIP L = 2000-5000 μm, W = 300-600 μm

30A, 30W 400-1000nm

* Please contact us for detailed shapes and specifications.

Supply / Storage

COS: 2 ”gel pack x1 (supply), 2” gel pack x3 (storage)

CHIP: 6 ”grip ring x1 (supply), 6” grip ring x2 or 2 ”gel pack x3 (storage)

Temperature Control/Range

・ Controlled by Peltier and water-cooled circulation

・ 25 ℃ ～ 95 ℃

Setting Items

・ IL measurement (CW, Pulse)

・ FFP measurement (vertical) (± 45 °)

・ FFP measurement (horizontal) (± 45 °)

・ Ir / VrLD (LD reverse current, reverse voltage)

・ Wavelength measurement

Shortwave: Ocean optics HR4000

​Tester